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the RTESPA-300-30 provides accurate nanomechanical mapping on stiff samples in air with controlled end radius and laser Doppler vibrometer calibrated spring constants
Dimensions of 25 TEM grid version: 35 x 35 x 6
Precision cutting tweezers for fine wire in electronics and thin film research
and Surface Potential Microscopy (SPoM) modes on the Dimension Series and BioScope AFMs
This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model LTESP-V2
Maxtaform Style H7 TipChecker the RTESPA-300-30 provides accurate nanomechanicalDESCRIPTION Maxtaform Style H7 Mesh: 400 Pitch: 63 microns Hole: 51 microns Bar Width: 12 microns Transmission: 65% Maxtaform Reference Finder Grids, Style H7, 400 mesh, Copper, 100 vial Maxtaform Reference Finder Grids, Style H7, 400 mesh, Nickel, 100 vial Reference Finder Grids for Transmission Electron Microscopy A selection of TEM grids with reference patterns to enable relocating a particular grid area. Theses grids are known as reference,
